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Instruments A Shimadzu 2600 UV/Vis spectrophotometer was used for 8-HQ sensor and all other reflection absorbance measurements in solid-state spot samples

March 17, 2019 0 Comment

Instruments
A Shimadzu 2600 UV/Vis spectrophotometer was used for 8-HQ sensor and all other reflection absorbance measurements in solid-state spot samples. A (X, PERT-PRO-PANalytical, Netherland) was used for measuring the small-angle powder X-ray diffraction (XRD) patterns. A Nova 3200 surface area and pore size analyzer was used for measuring the N2 adsorption-desorption isotherms. The isotherms adsorption curve was used for estimating of the pore size distribution by using nonlocal density functional theory (NLDFT). A (HR-TEM, Tecnai G20, FEI, Netherlands) (TEM) was used for imaging homogeneity and distribution on the nanosphere surfaces. A (Hitachi S-4300) (SEM) is used to visualize very small topographic details on the surfaces. An (Optima 2000 Dv Perkin Elmer, USA) (ICP-OES) was used for evaluating the different concentrations of V(II) ion.

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